FlowVIEW Tek specializes in automated image-based liquid inspection, utilizing proprietary nanomembrane technology and AI image recognition to provide highly efficient and precise particle detection for advanced industrial processes. Our technology breaks through existing limitations, achieving significant breakthroughs. Whether in semiconductor manufacturing, battery energy, or biomedical industries, our technology effectively addresses industry challenges and provides customers with more advanced solutions.Since our founding in 2017, we have been committed to providing innovative services such as micro-contamination detection, liquid sample inspection, and analysis. Each achievement represents our dedication to quality and innovation. In the future, we will continue our efforts to provide customers with more efficient and precise solutions.
2018
Aquarius Stater kit
FlowVIEW is the first in Taiwan to pioneer the use of nanomembrane technology in developing the Aquarius Starter Kit, enabling high-precision observation of liquid samples under a scanning electron microscope (SEM).
2019
Multi-channel Liquid Particle Counter
FlowVIEW’s multi-channel liquid particle detection system is designed for DI water and chemical liquids, enabling real-time particle monitoring and reducing operational costs through integrated equipment.
2020
Electrochemistry Stater kit
FlowVIEW has developed two electrochemical testing platforms for battery liquid analysis, a coin cell stage and the Nano scale membrane with tri-electrodes platform. These platforms enable in-situ observation of structural changes during charge-discharge cycles under SEM, supporting in-depth battery research and development.
2022
AI Particle Imager
FlowVIEW’s fully automated microfluidic imaging analyzer shortens inspection time and delivers critical particle data analysis, with optional AI-based particle classification to support high cleanliness standards across industries.
2024
AI Particle Imager LEADquid Series
FlowVIEW’s Imager S100 is designed for detecting 100 nm particles, meeting the strict demands of advanced semiconductor processes. It delivers high-precision inspection and supports the establishment of process standards through reliable data analysis.
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